Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser.

Y. Ren, A. He, S. Shi, G. Guo, L. Chen, S. Wen, R. Wong, N. van Vonno, and B. Bhuva. J. Electron. Test., 30 (1): 149-154 (2014)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Wen-Jie Dai

Zhou Jie

Yucheng Jie

Jie Huang

Jie Liu

Other publications of authors with the same name

A fully integrated 40pF output capacitor beat-frequency-quantizer-based digital LDO with built-in adaptive sampling and active voltage positioning.S. Kundu, M. Liu, R. Wong, S. Wen, and C. Kim. ISSCC, page 308-310. IEEE, (2018)Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller.Y. Ren, S. Shi, L. Chen, H. Wang, L. Gao, G. Guo, S. Wen, R. Wong, and N. van Vonno. J. Electron. Test., 29 (4): 609-616 (2013)Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser.Y. Ren, A. He, S. Shi, G. Guo, L. Chen, S. Wen, R. Wong, N. van Vonno, and B. Bhuva. J. Electron. Test., 30 (1): 149-154 (2014)Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies.J. Cao, L. Xu, B. Bhuva, S. Wen, R. Wong, B. Narasimham, and L. Massengill. IRPS, page 1-5. IEEE, (2019)Design method of NOR-type comparison circuit in CAM with ground bounce noise considerations.C. Jung, S. Baeg, S. Wen, and R. Wong. ISQED, page 390-397. IEEE, (2011)Study of proton radiation effect to row hammer fault in DDR4 SDRAMs.C. Lim, K. Park, G. Bak, D. Yun, M. Park, S. Baeg, S. Wen, and R. Wong. Microelectron. Reliab., (2018)Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams.G. Bak, S. Lee, H. Lee, K. Park, S. Baeg, S. Wen, R. Wong, and C. Slayman. IRPS, page 3. IEEE, (2015)New insights into the impact of SEUs in FPGA CRAMs.S. Wang, A. Evans, S. Wen, R. Wong, and G. Chen. IEICE Electron. Express, 12 (6): 20150110 (2015)Write Recovery Time Degradation by Thermal Neutrons in DDR4 DRAM Components.H. Oh, M. Chun, J. Lee, S. Wen, N. Yu, B. Park, and S. Baeg. IRPS, page 1-6. IEEE, (2023)Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node.Y. Xiong, A. Feeley, L. Massengill, B. Bhuva, S. Wen, and R. Fung. IRPS, page 1-5. IEEE, (2021)

BibSonomy

Disambiguation of "Wen, Shi-Jie"

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser.

Please choose a person to relate this publication to

Wen-Jie Dai

Zhou Jie

Yucheng Jie

Jie Huang

Jie Liu

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Wen, Shi-Jie"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser.

Please choose a person to relate this publication to

Wen-Jie Dai

Zhou Jie

Yucheng Jie

Jie Huang

Jie Liu

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser.