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Disambiguation of "Wen, Xiaoqing"

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Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing.

, , , , , , and . J. Electron. Test., 24 (4): 379-391 (2008)

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Xiaoqing Pan

Xiaoqing Liu

Xiaoqing Shen

Xiaoqing Li

Xiaoqing Jin

 

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Efficient Guided-Probe Fault Location Method for Sequential Circuits., , , and . IEICE Trans. Inf. Syst., 78-D (2): 122-129 (1995)Efficient Test Set Modification for Capture Power Reduction., , , , , , and . J. Low Power Electron., 1 (3): 319-330 (2005)A Double-Node-Upset Self-Recoverable Latch Design for High Performance and Low Power Application., , , , , , , and . IEEE Trans. Circuits Syst. II Express Briefs, 66-II (2): 287-291 (2019)A Method to Detect Bit Flips in a Soft-Error Resilient TCAM., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 37 (6): 1185-1196 (2018)Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 28 (11): 1767-1776 (2009)LCHR-TSV: Novel Low Cost and Highly Repairable Honeycomb-Based TSV Redundancy Architecture for Clustered Faults., , , , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 39 (10): 2938-2951 (2020)HITTSFL: Design of a Cost-Effective HIS-Insensitive TNU-Tolerant and SET-Filterable Latch for Safety-Critical Applications., , , , , , , and . DAC, page 1-6. IEEE, (2020)Power-aware test generation with guaranteed launch safety for at-speed scan testing., , , , , , , and . VTS, page 166-171. IEEE Computer Society, (2011)Power supply noise and its reduction in at-speed scan testing.. ASICON, page 1-4. IEEE, (2015)Trusted fingerprint localization for multimedia devices based on blockchain., , , , and . Inf. Sci., (2023)