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Signoff power methodology for contactless smartcards.

J. Mercier, C. Dufaza, and M. Lisart. ISLPED, page 407-410. ACM, (2007)

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Martin Mathieu

Herbert Mathieu

Mathieu Mathias

Theodor Mathieu

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Modeling Time Domain Magnetic Emissions of ICs.V. Lomné, P. Maurine, L. Torres, T. Ordas, M. Lisart, and J. Toublanc. PATMOS, volume 6448 of Lecture Notes in Computer Science, page 238-249. Springer, (2010)Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation.N. Borrel, C. Champeix, M. Lisart, A. Sarafianos, E. Kussener, W. Rahajandraibe, and J. Dutertre. IRPS, page 1. IEEE, (2015)Methodology for Dynamic Power Verification of Contactless Smartcards.J. Mercier, C. Dufaza, and M. Lisart. PATMOS, volume 4148 of Lecture Notes in Computer Science, page 280-291. Springer, (2006)Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents.C. Champeix, N. Borrel, J. Dutertre, B. Robisson, M. Lisart, and A. Sarafianos. IOLTS, page 150-155. IEEE, (2015)Local and Direct EM Injection of Power Into CMOS Integrated Circuits.F. Poucheret, K. Tobich, M. Lisart, L. Chusseau, B. Robisson, and P. Maurine. FDTC, page 100-104. IEEE Computer Society, (2011)Influence of triple-well technology on laser fault injection and laser sensor efficiency.N. Borrel, C. Champeix, E. Kussener, W. Rahajandraibe, M. Lisart, A. Sarafianos, and J. Dutertre. DFTS, page 85-90. IEEE Computer Society, (2015)Signoff power methodology for contactless smartcards.J. Mercier, C. Dufaza, and M. Lisart. ISLPED, page 407-410. ACM, (2007)Laser attacks on integrated circuits: From CMOS to FD-SOI.J. Dutertre, S. Castro, A. Sarafianos, N. Boher, B. Rouzeyre, M. Lisart, J. Damiens, P. Candelier, M. Flottes, and G. Natale. DTIS, page 1-6. IEEE, (2014)SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology.C. Champeix, N. Borrel, J. Dutertre, B. Robisson, M. Lisart, and A. Sarafianos. DFTS, page 177-182. IEEE Computer Society, (2015)Robustness improvement of an SRAM cell against laser-induced fault injection.A. Sarafianos, M. Lisart, O. Gagliano, V. Serradeil, C. Roscian, J. Dutertre, and A. Tria. DFTS, page 149-154. IEEE Computer Society, (2013)

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Disambiguation of "Lisart, Mathieu"

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Signoff power methodology for contactless smartcards.

Please choose a person to relate this publication to

Martin Mathieu

Herbert Mathieu

Herbert Mathieu

Mathieu Mathias

Theodor Mathieu

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Lisart, Mathieu"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Signoff power methodology for contactless smartcards.

Please choose a person to relate this publication to

Martin Mathieu

Herbert Mathieu

Herbert Mathieu

Mathieu Mathias

Theodor Mathieu

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
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URL
DOI
BibTeX
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APA
Chicago
DIN 1505
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Signoff power methodology for contactless smartcards.