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Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents.

, , , , , and . IOLTS, page 150-155. IEEE, (2015)

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Modeling Time Domain Magnetic Emissions of ICs., , , , , and . PATMOS, volume 6448 of Lecture Notes in Computer Science, page 238-249. Springer, (2010)Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation., , , , , , and . IRPS, page 1. IEEE, (2015)Methodology for Dynamic Power Verification of Contactless Smartcards., , and . PATMOS, volume 4148 of Lecture Notes in Computer Science, page 280-291. Springer, (2006)Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents., , , , , and . IOLTS, page 150-155. IEEE, (2015)Local and Direct EM Injection of Power Into CMOS Integrated Circuits., , , , , and . FDTC, page 100-104. IEEE Computer Society, (2011)Influence of triple-well technology on laser fault injection and laser sensor efficiency., , , , , , and . DFTS, page 85-90. IEEE Computer Society, (2015)Signoff power methodology for contactless smartcards., , and . ISLPED, page 407-410. ACM, (2007)Laser attacks on integrated circuits: From CMOS to FD-SOI., , , , , , , , , and . DTIS, page 1-6. IEEE, (2014)SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology., , , , , and . DFTS, page 177-182. IEEE Computer Society, (2015)Robustness improvement of an SRAM cell against laser-induced fault injection., , , , , , and . DFTS, page 149-154. IEEE Computer Society, (2013)