( en | de | ru )

 

Disambiguation of "Sánchez, Ernesto"

Author of the publication

copydeleteadd this publication to your clipboard
On the in-field test of Branch Prediction Units using the correlated predictor mechanism.

, , , , and . DDECS, page 286-289. IEEE Computer Society, (2014)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

David Sánchez Sánchez

Antonia Sánchez

Yerson Sánchez

David Sánchez

Nydia Sánchez

 

Other publications of authors with the same name

Code Generation for Functional Validation of Pipelined Microprocessors., , , and . J. Electron. Test., 20 (3): 269-278 (2004)Simulation-based Equivalence Checking between IEEE 1687 ICL and RTL., , , , , and . ITC, page 1-8. IEEE, (2019)Software-Based Self-Test Techniques for Dual-Issue Embedded Processors., , , , , and . IEEE Trans. Emerg. Top. Comput., 8 (2): 464-477 (2020)New evolutionary techniques for test-program generation for complex microprocessor cores., , , , , and . GECCO, page 2193-2194. ACM, (2005)Evolutionary failing-test generation for modern microprocessors., , and . GECCO (Companion), page 225-226. ACM, (2011)Exploiting Evolutionary Computation in an Industrial Flow for the Development of Code-Optimized Microprocessor Test Programs., , , and . GECCO (Companion), page 1465-1466. ACM, (2015)An Evolutionary Methodology for Test Generation for Peripheral Cores Via Dynamic FSM Extraction., , , and . EvoWorkshops, volume 4974 of Lecture Notes in Computer Science, page 214-223. Springer, (2008)Exploiting HW Acceleration for Classifying Complex Test Program Generation Problems., , and . EvoWorkshops, volume 3005 of Lecture Notes in Computer Science, page 230-239. Springer, (2004)Increasing reliability of safety critical applications through functional based solutions.. DTIS, page 1. IEEE, (2018)Functional Verification of DMA Controllers., , , , , , and . J. Electron. Test., 27 (4): 505-516 (2011)