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A Test Vector Ordering Technique for Switching Activity Reduction During Test Operation.

, , , and . Great Lakes Symposium on VLSI, page 24-. IEEE Computer Society, (1999)

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Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity., , , , , , , and . ISCAS (1), page 110-113. IEEE, (1999)Effect-cause intra-cell diagnosis at transistor level., , , , , , and . ISQED, page 460-467. IEEE, (2013)Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing., , , , , and . VLSI-SoC, page 403-408. IEEE, (2006)Energy Model based Control for Forming Processes., and . ICINCO-ICSO, page 51-59. INSTICC Press, (2008)Towards a Model-Based Approach to Support Physical Test Process of Aircraft Hydraulic Systems., , , , , and . MEDI, volume 12732 of Lecture Notes in Computer Science, page 33-40. Springer, (2021)Emerging Computing Devices: Challenges and Opportunities for Test and Reliability*., , , , , , , , , and 2 other author(s). ETS, page 1-10. IEEE, (2021)Fast Bridging Fault Diagnosis using Logic Information., , , , , and . ATS, page 33-38. IEEE, (2007)Power-Aware Test Data Compression for Embedded IP Cores., , , , , and . ATS, page 5-10. IEEE, (2006)Example-based programming: a pertinent visual approach for learning to program., , and . AVI, page 358-361. ACM Press, (2004)Validation d'une approche " basée sur exemples " pour l'apprentissage de la programmation., , and . IHM, volume 264 of ACM International Conference Proceeding Series, page 147-154. ACM, (2005)