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Disambiguation of "Ye, Tianchun"

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The Synergetic Effects of Total Ionizing Dose and High Temperature on 180 nm DSOI Technology.

, , , , , , , , and . APCCAS, page 532-535. IEEE, (2022)

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Tianchun He

Ye Zhang

Zhenyu Ye

Minzhen Ye

Ying Ye

 

Other publications of authors with the same name

Influence of an ALD TiN capping layer on the PBTI characteristics of n-FinFET with ALD HfO2/TiN-capping/TiAl gate stacks., , , , , , , , , and 5 other author(s). Sci. China Inf. Sci., 63 (2): 129403 (2020)Optimization and design of a novel prescaler and its application to GPS receivers., , and . Sci. China Inf. Sci., 54 (9): 1938-1944 (2011)A 95 dB dynamic range automatic gain control circuits and systems for Multi-standard Digital TV tuner., , , and . ISCAS, page 2482-2485. IEEE, (2014)The Synergetic Effects of Total Ionizing Dose and High Temperature on 180 nm DSOI Technology., , , , , , , , and . APCCAS, page 532-535. IEEE, (2022)Interconnect Delay and Slew Metrics Using the First Three Moments., , , and . ISQED, page 598-602. IEEE Computer Society, (2005)Research on the resonant frequency formula of V-shaped cantilevers., , , , and . NEMS, page 59-62. IEEE Computer Society, (2009)Accurate lifetime prediction for channel hot carrier stress on sub-1 nm equivalent oxide thickness HK/MG nMOSFET with thin titanium nitride capping layer., , , , , , , , , and 4 other author(s). Microelectron. Reliab., (2016)An optimization method for conformal shielding., , , , , and . IEICE Electron. Express, 18 (9): 20210022 (2021)The Effects of $\gamma$ Radiation-Induced Trapped Charges on Single Event Transient in DSOI Technology., , , , , , , , , and 1 other author(s). IRPS, page 1-6. IEEE, (2023)Worst-Case Crosstalk Noise Analysis Based on Dual-Exponential Noise Metrics., , , and . VLSI Design, page 348-353. IEEE Computer Society, (2005)