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Disambiguation of "Uemura, Taiki"

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Machine Learning Based V-ramp VBD Predictive Model Using OCD-measured Fab Parameters for Early Detection of MOL Reliability Risk.

, , , , , , , , and . IRPS, page 1-4. IEEE, (2023)

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Kenji Uemura

 

Other publications of authors with the same name

Thermal-Neutron SER Mitigation by Cobalt-Contact in 7 nm Bulk-FinFET Technology., , , , , , , , and . IRPS, page 7. IEEE, (2022)A 10th generation 16-core SPARC64 processor for mission-critical UNIX server., , , , , , , , , and 4 other author(s). ISSCC, page 60-61. IEEE, (2013)Early Diagnosis and Prediction of Wafer Quality Using Machine Learning on sub-10nm Logic Technology., , , , , , , , , and 8 other author(s). IRPS, page 1-5. IEEE, (2020)Critical charge dependence of correlation of different neutron sources for soft error testing., , , , and . IRPS, page 2. IEEE, (2015)Reliability of Industrial grade Embedded-STT-MRAM., , , , , , , , , and 21 other author(s). IRPS, page 1-3. IEEE, (2020)Advanced Self-heating Model and Methodology for Layout Proximity Effect in FinFET Technology., , , , , , , , , and 3 other author(s). IRPS, page 1-5. IEEE, (2020)Impact of package on neutron induced single event upset in 20 nm SRAM., , , and . IRPS, page 9. IEEE, (2015)Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET., , , , , , , , , and 6 other author(s). IRPS, page 1-5. IEEE, (2020)Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM., , , , , , , , , and 4 other author(s). IRPS, page 1-4. IEEE, (2020)Machine Learning Based V-ramp VBD Predictive Model Using OCD-measured Fab Parameters for Early Detection of MOL Reliability Risk., , , , , , , , and . IRPS, page 1-4. IEEE, (2023)