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Dynamic state-retention flip-flop for fine-grained power gating with small design and power overhead.

, , , , , , and . IEEE J. Solid State Circuits, 41 (7): 1654-1661 (2006)

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Soft Error Rates in 65nm SRAMs--Analysis of new Phenomena., and . IOLTS, page 203-204. IEEE Computer Society, (2007)From Device Aging Physics to Automated Circuit Reliability Sign Off., , , , , , and . IRPS, page 1-12. IEEE, (2019)From an analytic NBTI device model to reliability assessment of complex digital circuits., , , , , and . IOLTS, page 19-24. IEEE, (2014)In situ measurement of aging-induced performance degradation in digital circuits., , , , , and . ETS, page 1-2. IEEE, (2016)Power efficient digital IC design for a medical application with high reliability requirements., , , , , , , , and . PATMOS, page 1-5. IEEE, (2014)In situ measurement of aging-induced performance degradation in digital circuits., , , , , and . ETS, page 1-2. IEEE, (2016)A fWLR test structure and method for device reliability monitoring using product relevant circuits., , , and . IRPS, page 3. IEEE, (2015)A 90-nm CMOS Low-Power GSM/EDGE Multimedia-Enhanced Baseband Processor With 380-MHz ARM926 Core and Mixed-Signal Extensions., , , , , , , , , and 9 other author(s). IEEE J. Solid State Circuits, 42 (1): 134-144 (2007)Single Supply Voltage High-Speed Semi-dynamic Level-Converting Flip-Flop with Low Power and Area Consumption., , , and . PATMOS, volume 3254 of Lecture Notes in Computer Science, page 392-401. Springer, (2004)A Design Space Comparison of 6T and 8T SRAM Core-Cells., , and . PATMOS, volume 5349 of Lecture Notes in Computer Science, page 116-125. Springer, (2008)