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Другие публикации лиц с тем же именем

Soft Error Rates in 65nm SRAMs--Analysis of new Phenomena., и . IOLTS, стр. 203-204. IEEE Computer Society, (2007)From Device Aging Physics to Automated Circuit Reliability Sign Off., , , , , , и . IRPS, стр. 1-12. IEEE, (2019)From an analytic NBTI device model to reliability assessment of complex digital circuits., , , , , и . IOLTS, стр. 19-24. IEEE, (2014)In situ measurement of aging-induced performance degradation in digital circuits., , , , , и . ETS, стр. 1-2. IEEE, (2016)In situ measurement of aging-induced performance degradation in digital circuits., , , , , и . ETS, стр. 1-2. IEEE, (2016)Power efficient digital IC design for a medical application with high reliability requirements., , , , , , , , и . PATMOS, стр. 1-5. IEEE, (2014)Single Supply Voltage High-Speed Semi-dynamic Level-Converting Flip-Flop with Low Power and Area Consumption., , , и . PATMOS, том 3254 из Lecture Notes in Computer Science, стр. 392-401. Springer, (2004)A fWLR test structure and method for device reliability monitoring using product relevant circuits., , , и . IRPS, стр. 3. IEEE, (2015)A variation-aware adaptive voltage scaling technique based on in-situ delay monitoring., , , и . DDECS, стр. 261-266. IEEE Computer Society, (2011)A Design Space Comparison of 6T and 8T SRAM Core-Cells., , и . PATMOS, том 5349 из Lecture Notes in Computer Science, стр. 116-125. Springer, (2008)