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Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors.

A. Grill, V. John, J. Michl, A. Beckers, E. Bury, S. Tyaginov, B. Parvais, A. Chasin, T. Grasser, M. Waltl, B. Kaczer, and B. Govoreanu. IRPS, page 10. IEEE, (2022)

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Jda Chasin

Philip Stewart Chasin

Adrian Suter

Adrian Jitschin

Adrian Myers

Other publications of authors with the same name

A High Power Density Electrostatic Vibration-to-Electric Energy Converter Based On An In-Plane Overlap Plate (IPOP) MechanismA. Paracha, P. Basset, F. Marty, A. Chasin, P. Poulichet, and T. Bourouina. CoRR, (2008)The properties, effect and extraction of localized defect profiles from degraded FET characteristics.M. Vandemaele, B. Kaczer, S. Tyaginov, J. Franco, R. Degraeve, A. Chasin, Z. Wu, E. Bury, Y. Xiang, H. Mertens and 1 other author(s). IRPS, page 1-7. IEEE, (2021)MTJ degradation in SOT-MRAM by self-heating-induced diffusion.S. Beek, K. Cai, S. Rao, G. Jayakumar, S. Couet, N. Jossart, A. Chasin, and G. Kar. IRPS, page 4. IEEE, (2022)Conduction and Breakdown Mechanisms in Low-k Spacer and Nitride Spacer Dielectric Stacks in Middle of Line Interconnects.C. Wu, A. Chasin, S. Demuynck, N. Horiguchi, and K. Croes. IRPS, page 1-6. IEEE, (2020)New methodology for modelling MOL TDDB coping with variability.P. Roussel, A. Chasin, S. Demuynck, N. Horiguchi, D. Linten, and A. Mocuta. IRPS, page 3. IEEE, (2018)Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs.M. Vandemaele, B. Kaczer, S. Tyaginov, E. Bury, A. Chasin, J. Franco, A. Makarov, H. Mertens, G. Hellings, and G. Groeseneken. IRPS, page 6. IEEE, (2022)Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors.A. Grill, V. John, J. Michl, A. Beckers, E. Bury, S. Tyaginov, B. Parvais, A. Chasin, T. Grasser, M. Waltl and 2 other author(s). IRPS, page 10. IEEE, (2022)Stochastic Modeling of Hot-Carrier Degradation in nFinFETs Considering the Impact of Random Traps and Random Dopants.A. Makarov, D. Linten, S. Tyaginov, B. Kaczer, P. Roussel, A. Chasin, M. Vandemaele, G. Hellings, A. El-Sayed, M. Jech and 1 other author(s). ESSDERC, page 262-265. IEEE, (2019)Modelling ultra-fast threshold voltage instabilities in Hf-based ferroelectrics.B. O'Sullivan, B. Truijen, V. Putcha, A. Grill, A. Chasin, G. den Bosch, B. Kaczer, M. Alam, and J. Houdt. IRPS, page 4. IEEE, (2022)Side and Corner Region Non-Uniformities in Grown SiO2 and Their Implications on Current, Capacitance and Breakdown Characteristics.J. Bastos, B. O'Sullivan, Y. Higashi, A. Chasin, J. Franco, H. Arimura, J. Ganguly, E. Capogreco, A. Spessot, and N. Horiguchi. IRPS, page 36. IEEE, (2024)

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Disambiguation of "Chasin, Adrian Vaisman"

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Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors.

Please choose a person to relate this publication to

Jda Chasin

Philip Stewart Chasin

Adrian Suter

Adrian Jitschin

Adrian Myers

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Chasin, Adrian Vaisman"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors.

Please choose a person to relate this publication to

Jda Chasin

Philip Stewart Chasin

Adrian Suter

Adrian Jitschin

Adrian Myers

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
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APA
Chicago
DIN 1505
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Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors.