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Disambiguation of "Waltl, Michael"

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Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors.

, , , , , , , , , , , and . IRPS, page 10. IEEE, (2022)

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Gerhard Waltl

Peter Waltl

Hubert Waltl

Josef Waltl

Josef Waltl

 

Other publications of authors with the same name

Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors., , , , , , , , , and 2 other author(s). IRPS, page 10. IEEE, (2022)A Recombination-Enhanced-Defect-Reaction-Based Model for the Gate Switching Instability in SiC MOSFETs., , , , , , , , , and 2 other author(s). IRPS, page 3. IEEE, (2024)Hot-carrier degradation in single-layer double-gated graphene field-effect transistors., , , , , , , and . IRPS, page 2. IEEE, (2015)Neural Network with Optical Frequency-Coded ReLU., , , , , and . OFC, page 1-3. IEEE, (2024)Defect Spectroscopy in SiC Devices.. IRPS, page 1-9. IEEE, (2020)Characterization and physical modeling of the temporal evolution of near-interfacial states resulting from NBTI/PBTI stress in nMOS/pMOS transistors., , , , , , , , , and 1 other author(s). IRPS, page 2. IEEE, (2018)Quantum Mechanical Charge Trap Modeling to Explain BTI at Cryogenic Temperatures., , , , , , , , and . IRPS, page 1-6. IEEE, (2020)Utilizing NBTI for Operation Detection of Integrated Circuits., , and . VDAT, volume 1066 of Communications in Computer and Information Science, page 190-201. Springer, (2019)Design of Fault-Tolerant and Thermally Stable XOR Gate in Quantum dot Cellular Automata., , , , and . ETS, page 1-2. IEEE, (2021)Metastability of Negatively Charged Hydroxyl-E' Centers and their Potential Role in Positive Bias Temperature Instabilities., , , , , , and . ESSDERC, page 376-379. IEEE, (2022)