Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

TCAD modeling of performance and reliability of nano-scale memory devices.. Polytechnic University of Milan, Italy, (2014)High temperature stability embedded ReRAM for 2x nm node and beyond., , , , , , , , , and 9 other author(s). IMW, page 1-4. IEEE, (2022)Hardware calibrated learning to compensate heterogeneity in analog RRAM-based Spiking Neural Networks., , , , , , , , , and 3 other author(s). ISCAS, page 380-383. IEEE, (2022)Innovative GeS2/Sb2Te3 based phase change memory for low power applications., , , , , , , , , and 3 other author(s). NVMTS, page 1-4. IEEE, (2017)16kbit 1T1R OxRAM arrays embedded in 28nm FDSOI technology demonstrating low BER, high endurance, and compatibility with core logic transistors., , , , , , , , , and 20 other author(s). IMW, page 1-4. IEEE, (2021)Metal Oxide Resistive Memory (OxRAM) and Phase Change Memory (PCM) as Artificial Synapses in Spiking Neural Networks., , , , , , , , , and . ICECS, page 561-564. IEEE, (2018)Multilevel Programming Reliability in Si-doped GeSbTe for Storage Class Memory., , , , , , , , , and . IRPS, page 1-6. IEEE, (2021)Synaptic metaplasticity with multi-level memristive devices., , , , , , , and . AICAS, page 1-5. IEEE, (2023)Multilayer Structure in SeAsGeSi-based OTS for High Thermal Stability and Reliability Enhancement., , , , , , , , , and 6 other author(s). ESSDERC, page 225-228. IEEE, (2022)Enhanced Thermal Confinement in Phase-Change Memory Targeting Current Reduction., , , , , , , , , and 3 other author(s). ESSDERC, page 233-236. IEEE, (2022)