Author of the publication

Modelling Resistive Random Access Memories by means of Functional Principal Component Analysis.

, , , and . MDA, page 64-73. ibai Publishing, (2017)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Influence of the magnetic field on dielectric breakdown in memristors based on h-BN stacks., , , , , , , , and . IRPS, page 1-5. IEEE, (2020)Variability in Resistive Memories., , , , , , , , , and 10 other author(s). Adv. Intell. Syst., (June 2023)Behavioral modeling of multilevel HfO2-based memristors for neuromorphic circuit simulation., , , , , , , and . DCIS, page 1-6. IEEE, (2020)An enhanced Verilog-A compact model for bipolar RRAMs including transient thermal effects and series resistance., , , , and . DCIS, page 1-6. IEEE, (2022)Reversible dielectric breakdown in h-BN stacks: a statistical study of the switching voltages., , , , , , , , , and 3 other author(s). IRPS, page 1-5. IEEE, (2020)Modelling Resistive Random Access Memories by means of Functional Principal Component Analysis., , , and . MDA, page 64-73. ibai Publishing, (2017)Hardware implementation of self-organizing maps using memristors, a simulation study., , and . DCIS, page 1-6. IEEE, (2022)Impact of Intrinsic Series Resistance on the Reversible Dielectric Breakdown Kinetics in HfO2 Memristors., , , , , and . IRPS, page 1-4. IEEE, (2020)A physically based SPICE model for RRAMs including RTN., , , , and . DCIS, page 1-6. IEEE, (2020)Time series modeling of the cycle-to-cycle variability in h-BN based memristors., , , , , , , , and . IRPS, page 1-5. IEEE, (2021)