From post

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

 

Другие публикации лиц с тем же именем

A 27% active and 85% standby power reduction in dual-power-supply SRAM using BL power calculator and digitally controllable retention circuit., , , , , , , , , и 1 other автор(ы). ISSCC, стр. 320-321. IEEE, (2013)Energy efficiency deterioration by variability in SRAM and circuit techniques for energy saving without voltage reduction., , , , , , , и . ICICDT, стр. 1-4. IEEE, (2012)A 47% access time reduction with a worst-case timing-generation scheme utilizing a statistical method for ultra low voltage SRAMs., , , , , , , и . VLSIC, стр. 100-101. IEEE, (2012)A configurable SRAM with constant-negative-level write buffer for low-voltage operation with 0.149µm2 cell in 32nm high-k metal-gate CMOS., , , , , , , , , и 1 other автор(ы). ISSCC, стр. 348-349. IEEE, (2010)A trimless, 0.5V-1.0V wide voltage operation, high density SRAM macro utilizing dynamic cell stability monitor and multiple memory cell access., , , , , , , , , и 2 other автор(ы). A-SSCC, стр. 161-164. IEEE, (2011)A 0.7 V Single-Supply SRAM With 0.495 µm2 Cell in 65 nm Technology Utilizing Self-Write-Back Sense Amplifier and Cascaded Bit Line Scheme., , , , , , , , , и . IEEE J. Solid State Circuits, 44 (4): 1192-1198 (2009)A Single-Power-Supply 0.7V 1GHz 45nm SRAM with An Asymmetrical Unit-×-ratio Memory Cell., , , , , , , , , и 1 other автор(ы). ISSCC, стр. 382-383. IEEE, (2008)DFT Techniques for Wafer-Level At-Speed Testing of High-Speed SRAMs., , , , , , , и . ITC, стр. 164-169. IEEE Computer Society, (2002)A process-variation-tolerant dual-power-supply SRAM with 0.179µm2 Cell in 40nm CMOS using level-programmable wordline driver., , , , , , , , , и 3 other автор(ы). ISSCC, стр. 458-459. IEEE, (2009)Direct Cell-Stability Test Techniques for an SRAM Macro with Asymmetric Cell-Bias-Voltage Modulation., , , , , , и . ITC, стр. 1-7. IEEE Computer Society, (2008)