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Heat Generation and Transport in Nanometer-Scale Transistors., , and . Proc. IEEE, 94 (8): 1587-1601 (2006)Bias Stress Stability of ITO Transistors and its Dependence on Dielectric Properties., , , , , , , , , and . DRC, page 1-2. IEEE, (2022)Probing Self-Heating in RRAM Devices by Sub-100 nm Spatially Resolved Thermometry., , , , and . DRC, page 1-2. IEEE, (2018)Flexible Low-Power Superlattice-Like Phase Change Memory., , and . DRC, page 1. IEEE, (2020)A Novel ESD Clamp Based on the VO2 Insulator-Metal Transition., , , , , and . DRC, page 203-204. IEEE, (2019)Ultrathin Gate Dielectric Enabled by Nanofog Aluminum Oxide on Monolayer MoS2., , , , , , , , , and . ESSDERC, page 1-4. IEEE, (2023)Mobility Enhancement of Monolayer MoS2 Transistors using Tensile-Stressed Silicon Nitride Capping Layers., , , , and . DRC, page 1-2. IEEE, (2022)A Systems Approach to Computing in Beyond CMOS Fabrics: Invited., , , , , , , , , and 2 other author(s). DAC, page 18:1-18:2. ACM, (2017)In Quest of the Next Information Processing Substrate: Extended Abstract: Invited., , , , , , , , , and 2 other author(s). DAC, page 17:1-17:6. ACM, (2017)Energy efficiency and conversion in 1D and 2D electronics., , , , , , , and . ESSDERC, page 35-37. IEEE, (2014)