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What we know after twelve years developing and deploying test data analytics solutions., , и . ITC, стр. 1-8. IEEE, (2016)A machine learning approach to fab-of-origin attestation., , , , , и . ICCAD, стр. 92. ACM, (2016)Harnessing process variations for optimizing wafer-level probe-test flow., , , , , и . ITC, стр. 1-8. IEEE, (2016)Yield prognosis for fab-to-fab product migration., , , , , , и . VTS, стр. 1-6. IEEE Computer Society, (2015)Harnessing fabrication process signature for predicting yield across designs., , , , , и . ISCAS, стр. 898-901. IEEE, (2016)Statistical outlier screening as a test solution health monitor., , , и . ITC, стр. 1-10. IEEE, (2016)Yield Forecasting in Fab-to-Fab Production Migration Based on Bayesian Model Fusion., , , , , и . ICCAD, стр. 9-14. IEEE, (2015)Machine Learning-Based Adaptive Outlier Detection for Underkill Reduction in Analog/RF IC Testing., , , , , и . VTS, стр. 1-7. IEEE, (2023)Machine Learning-Based Overkill Reduction through Inter-Test Correlation., , , , , и . VTS, стр. 1-7. IEEE, (2022)Quality improvement and cost reduction using statistical outlier methods., , , и . ICCD, стр. 64-69. IEEE Computer Society, (2009)