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Single element correction in sorting algorithms with minimum delay overhead., , , and . LATW, page 1-6. IEEE, (2009)Reliability aware yield improvement technique for nanotechnology based circuits., , , , and . SBCCI, ACM, (2009)New Challenges for Designers of Fault Tolerant Embedded Systems Based on Future Technologies., and . IESS, volume 310 of IFIP Advances in Information and Communication Technology, page 312-313. Springer, (2009)Increasing memory yield in future technologies through innovative design., , , , and . ISQED, page 622-626. IEEE Computer Society, (2009)A soft error robust and power aware memory design., , , and . SBCCI, page 300-305. ACM, (2007)Majority Logic Mapping for Soft Error Dependability., , , and . J. Electron. Test., 24 (1-3): 83-92 (2008)Invariant checkers: An efficient low cost technique for run-time transient errors detection., , , and . IOLTS, page 35-40. IEEE Computer Society, (2009)SET Fault Tolerant Combinational Circuits Based on Majority Logic., , , , and . DFT, page 345-352. IEEE Computer Society, (2006)Using Memory to Cope with Simultaneous Transient Faults., , and . LATW, page 151-156. IEEE, (2006)Using built-in sensors to cope with long duration transient faults in future technologies., , , , and . ITC, page 1-10. IEEE Computer Society, (2007)