( en | de | ru )

 

Disambiguation of "Saluja, Kewal K."

Author of the publication

copydeleteadd this publication to your clipboard
Thermal Extension of the Total Bandwidth Server.

, , , , and . VLSID, page 47-52. IEEE Computer Society, (2015)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Heinz Kewald

Kewal Krishen Mehta

Aman K K Bhasin

K Böhm

K Schaber

 

Other publications of authors with the same name

A Novel Approach for Testing Memories Using a Built-In Self Testing Technique., and . ITC, page 830-839. IEEE Computer Society, (1986)Identifying high variability speed-limiting paths under aging., , , and . LATS, page 1-6. IEEE, (2017)A low cost approach to calibrate on-chip thermal sensors., , , , and . ISQED, page 572-576. IEEE, (2011)Testable Design of Single-Output Sequential Machines Using Checking Experiments., and . IEEE Trans. Computers, 35 (7): 658-662 (1986)SEU tolerant SRAM cell., , , , and . ISQED, page 597-602. IEEE, (2011)Transient Fault Resilient QR Factorization on GPUs., , and . FTXS@HPDC, page 63-70. ACM, (2015)Optimal Sensor Distribution for Maximum Exposure in A Region with Obstacles., , and . GLOBECOM, IEEE, (2006)Diagnosing At-Speed Scan BIST Circuits Using a Low Speed and Low Memory Tester., , , and . IEEE Trans. Very Large Scale Integr. Syst., 15 (7): 790-800 (2007)A Study of Capture-Safe Test Generation Flow for At-Speed Testing., , , , , , , , , and 1 other author(s). IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 93-A (7): 1309-1318 (2010)A Novel ATPG Method for Capture Power Reduction during Scan Testing., , , , , , and . IEICE Trans. Inf. Syst., 90-D (9): 1398-1405 (2007)