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Disambiguation of "Kajihara, Seiji"

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A Novel ATPG Method for Capture Power Reduction during Scan Testing.

, , , , , , and . IEICE Trans. Inf. Syst., 90-D (9): 1398-1405 (2007)

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Seiji Miyashiro

Seiji Osawa

 

Other publications of authors with the same name

On the Efficacy of Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption., , , , , and . IEICE Trans. Inf. Syst., 104-D (6): 816-827 (2021)Removal of redundancy in combinational circuits under classification of undetectable faults., , and . Syst. Comput. Jpn., 24 (7): 31-40 (1993)On compacting test sets by addition and removal of test vectors., , , and . VTS, page 202-207. IEEE Computer Society, (1994)Reduction of NBTI-Induced Degradation on Ring Oscillators in FPGA., , , and . PRDC, page 59-67. IEEE Computer Society, (2014)On Guaranteeing Capture Safety in At-Speed Scan Testing with Broadcast-Scan-Based Test Compression., , , , , and . VLSI Design, page 279-284. IEEE Computer Society, (2013)On Testing of Interconnect Open Defects in Combinational Logic Circuits with Stems of Large Fanout., , , , and . ITC, page 83-89. IEEE Computer Society, (2002)On validating data hold times for flip-flops in sequential circuits., , , , , and . ITC, page 317-325. IEEE Computer Society, (2000)LCTI-SS: Low-Clock-Tree-Impact Scan Segmentation for Avoiding Shift Timing Failures in Scan Testing., , , , , and . IEEE Des. Test, 30 (4): 60-70 (2013)A Statistical Quality Model for Delay Testing., , , , and . IEICE Trans. Electron., 89-C (3): 349-355 (2006)Acceleration Techniques of Multiple Fault Test Generation Using Vector Pair Analysis., , , and . IEICE Trans. Inf. Syst., 78-D (7): 811-816 (1995)