( en | de | ru )

 

Disambiguation of "Williams, Thomas W."

Author of the publication

copydeleteadd this publication to your clipboard
Statistical Delay Fault Coverage and Defect Level for Delay Faults.

, , and . ITC, page 492-499. IEEE Computer Society, (1988)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Rhys W Williams

Simone Williams

Benjamin Williams

Thomas Herbert Parry- Williams

Jenny Williams

 

Other publications of authors with the same name

Delay Testing Quality in Timing-Optimized Designs., , , and . ITC, page 897-905. IEEE Computer Society, (1991)Fast seed computation for reseeding shift register in test pattern compression., , and . ICCAD, page 76-81. ACM / IEEE Computer Society, (2002)Using Logic Models To Predict The Detection Behavior Of Statistical Timing Defects., , , , , , and . ITC, page 1041-1050. IEEE Computer Society, (2003)Tester retargetable patterns., and . ITC, page 721-727. IEEE Computer Society, (2001)Changing the Scan Enable during Shift., , , , , and . VTS, page 73-78. IEEE Computer Society, (2004)IDDQ Test: Sensitivity Analysis of Scaling., , , , and . ITC, page 786-792. IEEE Computer Society, (1996)On Efficiently and Reliably Achieving Low Defective Part Levels., , and . ITC, page 616-625. IEEE Computer Society, (1995)Test Pattern Compression Using Prelude Vectors in Fan-Out Scan Chain with Feedback Architecture., , , and . DATE, page 10110-10115. IEEE Computer Society, (2003)Directed-Binary Search in Logic BIST Diagnostics., , and . DATE, page 1121. IEEE Computer Society, (2002)Design for Testability: The Path to Deep Submicron.. Asian Test Symposium, IEEE Computer Society, (2005)