Author of the publication

Statistical Delay Fault Coverage and Defect Level for Delay Faults.

, , and . ITC, page 492-499. IEEE Computer Society, (1988)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Balanced Excitation and Its Effect on the Fortuitous Detection of Dynamic Defects., , , and . DATE, page 1066-1071. IEEE Computer Society, (2004)On the decline of testing efficiency as fault coverage approaches 100%., , , and . VTS, page 74-83. IEEE Computer Society, (1995)Function-Based Dynamic Compaction and its Impact on Test Set Sizes., , and . DFT, page 167-174. IEEE Computer Society, (2003)An Efficient Delay Test Generation System for Combinational Logic Circuits., and . DAC, page 522-528. IEEE Computer Society Press, (1990)Heuristics to Compute Variable Orderings for Efficient Manipulation of Ordered Binary Decision Diagrams., , , and . DAC, page 417-420. ACM, (1991)A Deterministic Approach to Adjacency Testing for Delay Faults., and . DAC, page 351-356. ACM Press, (1989)A Method of Delay Fault Test Generation., and . DAC, page 90-95. ACM, (1988)The Influences of Fault Type and Topology on Fault Model Performance and the Implications to Test and Testable Design., and . DAC, page 673-678. IEEE Computer Society Press, (1990)Iddq Testing for High Performance CMOS - The Next Ten Years., , , , and . ED&TC, page 578-583. IEEE Computer Society, (1996)Test Generation for Highly Sequential Scan-Testable Circuits Through Logic Transformation., , and . ITC, page 561-565. IEEE Computer Society, (1981)