%0 Journal Article %1 journals/et/HigamiTSK00 %A Higami, Yoshinobu %A Takamatsu, Yuzo %A Saluja, Kewal K. %A Kinoshita, Kozo %D 2000 %J J. Electron. Test. %K dblp %N 5 %P 443-451 %T Algorithms to Select IDDQ Measurement Vectors for Bridging Faults in Sequential Circuits. %U http://dblp.uni-trier.de/db/journals/et/et16.html#HigamiTSK00 %V 16

@article{journals/et/HigamiTSK00, added-at = {2020-09-11T00:00:00.000+0200}, author = {Higami, Yoshinobu and Takamatsu, Yuzo and Saluja, Kewal K. and Kinoshita, Kozo}, biburl = {https://www.bibsonomy.org/bibtex/2eb80fbfb24246f5a35ea45f84b89810c/dblp}, ee = {https://www.wikidata.org/entity/Q56953862}, interhash = {603a2ea6f5da0745715ceab2801fb60c}, intrahash = {eb80fbfb24246f5a35ea45f84b89810c}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 5, pages = {443-451}, timestamp = {2020-09-12T11:41:32.000+0200}, title = {Algorithms to Select IDDQ Measurement Vectors for Bridging Faults in Sequential Circuits.}, url = {http://dblp.uni-trier.de/db/journals/et/et16.html#HigamiTSK00}, volume = 16, year = 2000 }