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Algorithms to Select IDDQ Measurement Vectors for Bridging Faults in Sequential Circuits.

Y. Higami, Y. Takamatsu, K. Saluja, and K. Kinoshita. J. Electron. Test., 16 (5): 443-451 (2000)

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Yoshinobu Kumazawa

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Compaction of pass/fail-based diagnostic test vectors for combinational and sequential circuits.Y. Higami, K. Saluja, H. Takahashi, S. ya Kobayashi, and Y. Takamatsu. ASP-DAC, page 659-664. IEEE, (2006)On the fault diagnosis in the presence of unknown fault models using pass/fail information.T. Seiyama, H. Takahashi, Y. Higami, K. Yamazaki, and Y. Takamatsu. ISCAS (3), page 2987-2990. IEEE, (2005)On selection of adjacent lines in test pattern generation for delay faults considering crosstalk effects.Y. Ohama, H. Yotsuyanagi, M. Hashizume, Y. Higami, and H. Takahashi. ISCIT, page 1-5. IEEE, (2017)Discrimination of a Resistive Open Using Anomaly Detection of Delay Variation Induced by Transitions on Adjacent Lines.H. Yotsuyanagi, K. Ise, M. Hashizume, Y. Higami, and H. Takahashi. IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 100-A (12): 2842-2850 (2017)Maximizing Stuck-Open Fault Coverage Using Stuck-at Test Vectors.Y. Higami, K. Saluja, H. Takahashi, S. ya Kobayashi, and Y. Takamatsu. IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 91-A (12): 3506-3513 (2008)Formulation of a Test Pattern Measure That Counts Distinguished Fault-Pairs for Circuit Fault Diagnosis.T. Inamoto, and Y. Higami. IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 103-A (12): 1456-1463 (2020)Test cost reduction for logic circuits: Reduction of test data volume and test application time.Y. Higami, S. Kajihara, H. Ichihara, and Y. Takamatsu. Syst. Comput. Jpn., 36 (6): 69-83 (2005)Partially Parallel Scan Chain for Test Length Reduction by Using Retiming Technique.Y. Higami, S. Kajihara, and K. Kinoshita. Asian Test Symposium, page 94-99. IEEE Computer Society, (1996)On Detecting Transition Faults in the Presence of Clock Delay Faults.Y. Higami, H. Takahashi, S. ya Kobayashi, and K. Saluja. Asian Test Symposium, page 1-6. IEEE Computer Society, (2011)Comparative Evaluation of Bluetooth and Wi-Fi Direct for Tablet-Oriented Educational Applications.K. Endo, A. Onoyama, D. Okano, Y. Higami, and S. ya Kobayashi. ACIIDS (1), volume 10191 of Lecture Notes in Computer Science, page 345-354. (2017)

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Disambiguation of "Higami, Yoshinobu"

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Algorithms to Select IDDQ Measurement Vectors for Bridging Faults in Sequential Circuits.

Please choose a person to relate this publication to

Yoshinobu Kumazawa

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Disambiguation

BibSonomy

Disambiguation of "Higami, Yoshinobu"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Algorithms to Select IDDQ Measurement Vectors for Bridging Faults in Sequential Circuits.

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Yoshinobu Kumazawa

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Algorithms to Select IDDQ Measurement Vectors for Bridging Faults in Sequential Circuits.