( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
Region-Based Sensor Selection for Wireless Sensor Networks.

, , , и . SUTC, стр. 326-331. IEEE Computer Society, (2008)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Shin'ichiro Nakamura

Makoto Nakamura

Akira Nakamura

Hatsuo Nakamura

Hideki Nakamura

 

Другие публикации лиц с тем же именем

Doing Community: Co-construction of Meaning and Use with Interactive Information Kiosks., , , , , и . UbiComp, том 4206 из Lecture Notes in Computer Science, стр. 387-403. Springer, (2006)Inferring Long-term User Properties Based on Users' Location History., , , , , , и . IJCAI, стр. 2159-2165. (2007)Spinning Multiple Social Networks for Semantic Web., , , , , , , , и . AAAI, стр. 1381-1387. AAAI Press, (2006)Automatic process design from nonprocedural specification., , и . Syst. Comput. Jpn., 26 (3): 1-16 (1995)Artificial Neural Network Based Test Escape Screening Using Generative Model., , и . ITC, стр. 1-8. IEEE, (2018)Region-Based Sensor Selection for Wireless Sensor Networks., , , и . SUTC, стр. 326-331. IEEE Computer Society, (2008)A System of Card Type Battery-Less Information Terminal: CardBIT for Situated Interactio., , , и . PerCom, стр. 369-377. IEEE Computer Society, (2003)Error Identification in At-Speed Scan BIST Environment in the Presence of Circuit and Tester Speed Mismatch., , , и . IEICE Trans. Inf. Syst., 89-D (3): 1165-1172 (2006)Defect Level vs. Yield and Fault Coverage in the Presence of an Unreliable BIST., , и . IEICE Trans. Inf. Syst., 88-D (6): 1210-1216 (2005)Diagnosing At-Speed Scan BIST Circuits Using a Low Speed and Low Memory Tester., , , и . ATS, стр. 409-414. IEEE, (2006)