Author of the publication

Diagnostic simulation of stuck-at faults in sequential circuits using compact lists.

, , , , , and . ACM Trans. Design Autom. Electr. Syst., 6 (4): 471-489 (2001)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Testing of Prebond Through Silicon Vias., , and . IEEE Des. Test, 37 (4): 27-34 (2020)Efficient Transition Fault ATPG Algorithms Based on Stuck-At Test Vectors., , , and . J. Electron. Test., 19 (4): 437-445 (2003)Algorithms to compute bridging fault coverage of IDDQ test sets., , and . ACM Trans. Design Autom. Electr. Syst., 2 (3): 281-305 (1997)Diagnostic simulation of stuck-at faults in sequential circuits using compact lists., , , , , and . ACM Trans. Design Autom. Electr. Syst., 6 (4): 471-489 (2001)Special session 11C: Hot topic design consideration and silicon evaluation of on-chip monitors.. VTS, page 350. IEEE Computer Society, (2010)An Evolutionary Functional Link Neural Fuzzy Model for Financial Time Series Forecasting., , , and . Int. J. Appl. Evol. Comput., 2 (3): 39-58 (2011)A Hybrid Kernel Extreme Learning Machine and Improved Cat Swarm Optimization for Microarray Medical Data Classification., , and . Int. J. Appl. Evol. Comput., 7 (3): 71-100 (2016)Algorithm to extract two-node bridges., and . IEEE Trans. Very Large Scale Integr. Syst., 11 (4): 741-744 (2003)Ensuring Power-Safe Application of Test Patterns Using an Effective Gating Approach Considering Current Limits., , and . J. Low Power Electron., 8 (2): 235-247 (2012)On Computing Signal Probability and Detection Probability of Stuck-at Faults., and . IEEE Trans. Computers, 39 (11): 1369-1377 (1990)