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Process Variability Challenges for Radiation Mitigation Techniques on 16nm.

, , and . LASCAS, page 69-72. IEEE, (2019)

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Temperature dependence and ZTC bias point evaluation of sub 20nm bulk multigate devices., , , and . ICECS, page 270-273. IEEE, (2017)Logic and Physical Synthesis of Cell Arrays., , and . ICECS, page 1292-1295. IEEE, (2007)Impact of Near-Threshold and Variability on 7nm FinFET XOR Circuits., , and . ICECS, page 573-576. IEEE, (2018)Evaluation of heavy-ion impact in bulk and FDSOI devices under ZTC condition., , , , and . Microelectron. Reliab., (2017)Impact of different transistor arrangements on gate variability., , , , , and . Microelectron. Reliab., (2018)Inserting permanent fault input dependence on PTM to improve robustness evaluation., , , , , and . SBCCI, page 1-6. IEEE, (2016)Radiation Effects in XOR Logic Gates at 16nm CMOS and FinFET Technology., , and . ICECS, page 590-593. IEEE, (2019)Accuracy-Configurable 2-D Gaussian Filter Architecture for Energy-Efficient Image Processing., , , and . IEEE Des. Test, 39 (2): 31-37 (2022)Multi-Level Design Influences on Robustness Evaluation of 7nm FinFET Technology., , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 67-I (2): 553-564 (2020)Energy-Efficient Design of Approximated Full Adders., and . ICECS, page 1-4. IEEE, (2020)