Author of the publication

An Algorithm to Test Rams for Physical Neighborhood Pattern Sensitive Faults.

, and . ITC, page 675-684. IEEE Computer Society, (1991)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Privacy Assurances in Multiple Data-Aggregation Transactions., , and . ICISC, volume 8565 of Lecture Notes in Computer Science, page 3-19. Springer, (2013)Modified T-Flip-Flop based scan cell for RAS., , , , and . European Test Symposium, page 113-118. IEEE Computer Society, (2010)Analytic modeling of detection latency in mobile sensor networks., , and . IPSN, page 194-201. ACM, (2006)Easily Testable Two-Dimensional Cellular Logic Arrays., and . IEEE Trans. Computers, 23 (11): 1204-1207 (1974)Theory, Analysis and Implementation of an On-Line BIST Technique., and . VLSI Design, 1 (1): 9-22 (1993)Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing., , , , , and . DAC, page 527-532. IEEE, (2007)An Algorithm to Test Rams for Physical Neighborhood Pattern Sensitive Faults., and . ITC, page 675-684. IEEE Computer Society, (1991)Routing TCP Flows in Underwater Mesh Networks., , and . IEEE J. Sel. Areas Commun., 29 (10): 2022-2032 (2011)Test Generation for Delay Faults on Clock Lines under Launch-on-Capture Test Environment., , , and . IEICE Trans. Inf. Syst., 96-D (6): 1323-1331 (2013)Fault Simulation and Test Generation for Transistor Shorts Using Stuck-at Test Tools., , , , and . IEICE Trans. Inf. Syst., 91-D (3): 690-699 (2008)