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Disambiguation of "Schuermyer, Chris"

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Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results.

, , , and . IEEE Des. Test Comput., 29 (1): 8-18 (2012)

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Chris Thümmler

Chris Protzel

Chris Fröhlich

Chris Mühlhausen

Chris Bendall

 

Other publications of authors with the same name

In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost., , , , , and . ITC, page 203-212. IEEE Computer Society, (2004)Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ., , , , , and . ITC, page 565-573. IEEE Computer Society, (2003)Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results., , , and . IEEE Des. Test Comput., 29 (1): 8-18 (2012)A Hybrid Flow for Memory Failure Bitmap Classification., , , , , , and . Asian Test Symposium, page 314-319. IEEE Computer Society, (2012)Impact of Multiple-Detect Test Patterns on Product Quality., , , , , , , and . ITC, page 1031-1040. IEEE Computer Society, (2003)Deriving Feature Fail Rate from Silicon Volume Diagnostics Data., , , , , and . IEEE Des. Test, 30 (4): 26-34 (2013)Extracting Defect Density and Size Distributions from Product ICs., , , , , , , and . IEEE Des. Test Comput., 23 (5): 390-400 (2006)Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis., , , and . ITC, page 9. IEEE Computer Society, (2005)Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis., , and . IEEE Des. Test Comput., 27 (3): 54-61 (2010)Minimum Testing Requirements to Screen Temperature Dependent Defects., , and . ITC, page 300-308. IEEE Computer Society, (2004)