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Diagnosis of failing scan cells through orthogonal response compaction., , , , , и . European Test Symposium, стр. 221-226. IEEE Computer Society, (2010)Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers., , , и . IEEE Des. Test Comput., 23 (2): 100-109 (2006)Obtaining High Defect Coverage for Frequency-Dependent Defects in Complex ASICs., , и . IEEE Des. Test Comput., 20 (5): 46-53 (2003)Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs., , , , , и . J. Electron. Test., 27 (5): 599-609 (2011)Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models., , , , , , , , и . ATS, стр. 318-323. IEEE Computer Society, (2014)Extracting Defect Density and Size Distributions from Product ICs., , , , , , , и . IEEE Des. Test Comput., 23 (5): 390-400 (2006)Case study: effectiveness of high-speed scan based feed forward voltage testing in reducing DPPM on a high volume ASIC., , и . ITC, стр. 7. IEEE Computer Society, (2005)Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis., , , и . ITC, стр. 9. IEEE Computer Society, (2005)The value of statistical testing for quality, yield and test cost improvement., , , и . ITC, стр. 10. IEEE Computer Society, (2005)A novel Test Access Mechanism for failure diagnosis of multiple isolated identical cores., , , , и . ITC, стр. 1-9. IEEE Computer Society, (2011)