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Другие публикации лиц с тем же именем

Broadside Transition Test Generation for Partial Scan Circuits through Stuck-at Test Generation., , и . VLSI-SoC (Selected Papers), том 249 из IFIP, стр. 301-316. Springer, (2006)An approach to test synthesis from higher level., и . Integr., 26 (1-2): 101-116 (1998)Diagnosing At-Speed Scan BIST Circuits Using a Low Speed and Low Memory Tester., , , и . IEEE Trans. Very Large Scale Integr. Syst., 15 (7): 790-800 (2007)System-on-chip test scheduling with reconfigurable core wrappers., и . IEEE Trans. Very Large Scale Integr. Syst., 14 (3): 305-309 (2006)A cost optimal parallel algorithm for weighted distance transforms., , , и . Parallel Comput., 25 (4): 405-416 (1999)A Latency Optimal Superstabilizing Mutual Exclusion Protocol in Unidirectional Rings., , , и . J. Parallel Distributed Comput., 62 (5): 865-884 (2002)The Complexity of Fault Detection Problems for Combinational Logic Circuits., и . IEEE Trans. Computers, 31 (6): 555-560 (1982)Optimal Wait-Free Clock Synchronisation Protocol on a Shared-Memory Multi-processor System., , , и . WDAG, том 1320 из Lecture Notes in Computer Science, стр. 290-304. Springer, (1997)Brief Announcement: Acceleration by Contention for Shared Memory Mutual Exclusion Algorithms., , и . DISC, том 5805 из Lecture Notes in Computer Science, стр. 172-173. Springer, (2009)A Test Generation Method Based on k-Cycle Testing for Finite State Machines., , и . IOLTS, стр. 232-235. IEEE, (2019)