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Targeted Partial-Shift For Mitigating Shift Switching Activity Hot-Spots During Scan Test., , and . PRDC, page 124-129. IEEE, (2019)Evaluation and Test of Production Defects in Hardened Latches., , , , and . IEICE Trans. Inf. Syst., 105-D (5): 996-1009 (2022)Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling., , and . MCSoC, page 501-507. IEEE, (2023)BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell., , , , and . ETS, page 1-6. IEEE, (2023)Logic Fault Diagnosis of Hidden Delay Defects., , , , , , and . ITC, page 1-10. IEEE, (2020)A Fault-Tolerant MPSoC For CubeSats., , , , , , , , , and . DFT, page 1-6. IEEE, (2019)STAHL: A Novel Scan-Test-Aware Hardened Latch Design., , , , and . ETS, page 1-6. IEEE, (2019)Stock price movement prediction based on Stocktwits investor sentiment using FinBERT and ensemble SVM., , and . PeerJ Comput. Sci., (2023)Clock-Skew-Aware Scan Chain Grouping for Mitigating Shift Timing Failures in Low-Power Scan Testing., , , , , , and . ATS, page 149-154. IEEE, (2018)GPU-Accelerated Estimation and Targeted Reduction of Peak IR-Drop during Scan Chain Shifting., , and . IEICE Trans. Inf. Syst., 106 (10): 1694-1704 (October 2023)