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Targeted Partial-Shift For Mitigating Shift Switching Activity Hot-Spots During Scan Test., , и . PRDC, стр. 124-129. IEEE, (2019)Evaluation and Test of Production Defects in Hardened Latches., , , , и . IEICE Trans. Inf. Syst., 105-D (5): 996-1009 (2022)Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling., , и . MCSoC, стр. 501-507. IEEE, (2023)BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell., , , , и . ETS, стр. 1-6. IEEE, (2023)A Fault-Tolerant MPSoC For CubeSats., , , , , , , , , и . DFT, стр. 1-6. IEEE, (2019)Logic Fault Diagnosis of Hidden Delay Defects., , , , , , и . ITC, стр. 1-10. IEEE, (2020)STAHL: A Novel Scan-Test-Aware Hardened Latch Design., , , , и . ETS, стр. 1-6. IEEE, (2019)Stock price movement prediction based on Stocktwits investor sentiment using FinBERT and ensemble SVM., , и . PeerJ Comput. Sci., (2023)Clock-Skew-Aware Scan Chain Grouping for Mitigating Shift Timing Failures in Low-Power Scan Testing., , , , , , и . ATS, стр. 149-154. IEEE, (2018)Variation-Aware Small Delay Fault Diagnosis on Compressed Test Responses., , , , и . ITC, стр. 1-10. IEEE, (2019)