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Disambiguation of "Wang, Yangyuan"

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A Carrier-Based Analytic Model for Undoped (Lightly Doped) Ultra-Thin-Body Silicon-on-Insulator (UTB-SOI) MOSFETs.

, , , and . ISQED, page 127-132. IEEE Computer Society, (2006)

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Wang Wang

Linfang Wang

Investigation of the functions of 53BP1 in DNA demethylation. Uni Marburg, (2009)

Hanchun Wang

Qi Wang

Shifeng Wang

 

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Physical understanding and optimization of resistive switching characteristics in oxide-RRAM., , , , , , , , , and . ESSDERC, page 154-159. IEEE, (2016)The Challenges and Emerging Technologies for Low-Power Artificial Intelligence IoT Systems., , , , , , , , , and 3 other author(s). IEEE Trans. Circuits Syst. I Regul. Pap., 68 (12): 4821-4834 (2021)A Carrier-Based Analytic Model for Undoped (Lightly Doped) Ultra-Thin-Body Silicon-on-Insulator (UTB-SOI) MOSFETs., , , and . ISQED, page 127-132. IEEE Computer Society, (2006)Investigation on the amplitude coupling effect of random telegraph noise (RTN) in nanoscale FinFETs., , , , , , and . IRPS, page 6-1. IEEE, (2018)Resistive switching in organic memory devices for flexible applications., , , , , and . ISCAS, page 838-841. IEEE, (2014)12.1 A 148nW General-Purpose Event-Driven Intelligent Wake-Up Chip for AIoT Devices Using Asynchronous Spike-Based Feature Extractor and Convolutional Neural Network., , , , , , , , , and . ISSCC, page 436-438. IEEE, (2021)Hot carrier degradation behavior in SOI dynamic-threshold-voltage nMOSFET's (n-DTMOSFET) measured by gated-diode configuration., , , , , and . Microelectron. Reliab., 43 (5): 707-711 (2003)Highly Power-Efficient Active-RC Filters With Wide Bandwidth-Range Using Low-Gain Push-Pull Opamps., , , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 60-I (1): 95-107 (2013)Ultra-Low-Power and Performance-Improved Logic Circuit Using Hybrid TFET-MOSFET Standard Cells Topologies and Optimized Digital Front-End Process., , , , , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 68 (3): 1160-1170 (2021)Towards reliability-aware circuit design in nanoscale FinFET technology: - New-generation aging model and circuit reliability simulator., , , , , , , , , and 2 other author(s). ICCAD, page 780-785. IEEE, (2017)