Author of the publication

Attempts Toward Behavior Recognition of the Asian Black Bears Using an Accelerometer.

, , , , and . ABC, volume 291 of Smart Innovation, Systems and Technologies, page 57-79. Springer, (2021)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Accelerating SDN/NFV with Transparent Offloading Architecture., , , , and . ONS, USENIX Association, (2014)Attempts Toward Behavior Recognition of the Asian Black Bears Using an Accelerometer., , , , and . ABC, volume 291 of Smart Innovation, Systems and Technologies, page 57-79. Springer, (2021)A Diagnostic Fault Simulation Method for a Single Universal Logical Fault Model., , , and . PRDC, page 217-218. IEEE Computer Society, (2017)A simple technique for locating gate-level faults in combinational circuits., , and . Asian Test Symposium, page 65-70. IEEE Computer Society, (1995)Post-BIST Fault Diagnosis for Multiple Faults., , , , , , and . IEICE Trans. Inf. Syst., 91-D (3): 771-775 (2008)A reliable procedure in a new power management technique for a 200-Gbps packet forwarding LSI., , , , , , , and . IEICE Electron. Express, 10 (11): 20130231 (2013)Fanout-based fault diagnosis for open faults on pass/fail information., and . ATS, page 349-353. IEEE, (2006)Identification of Redundant Crosspoint Faults in Sequential PLAs with Fault-Free Hardware Reset., , , and . Asian Test Symposium, page 269-274. IEEE Computer Society, (1999)Evaluation of transition untestable faults using a multi-cycle capture test generation method., , , and . DDECS, page 273-276. IEEE Computer Society, (2010)New Class of Tests for Open Faults with Considering Adjacent Lines., , , , , , and . Asian Test Symposium, page 301-306. IEEE Computer Society, (2009)