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Generating At-Speed Array Fail Maps with Low-Speed ATE.

, , и . VTS, стр. 87-96. IEEE Computer Society, (2004)

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Davinder Kumar Anand

Darren Gould

Darren Goins

Amar Frank Anand

Madhankumar Anandhakrishnan

 

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14NM FinFET 1.5MB Embedded High-K Charge Trap Transistor One Time Programmable Memory Using Dynamic Adaptive Programming., , , , , , , и . VLSI Circuits, стр. 87-88. IEEE, (2018)Shared fuse macro for multiple embedded memory devices with redundancy., , и . CICC, стр. 191-194. IEEE, (2001)Behavioral Modeling of a Charge Trap Transistor One Time Programmable Memory., , , , , , и . NATW, стр. 1-6. IEEE, (2019)An On-Chip Self-Repair Calculation and Fusing Methodology., , , , , , и . IEEE Des. Test Comput., 20 (5): 67-75 (2003)Low Cost Test of High Bandwidth Embedded Memories., , , и . CICC, стр. 445-448. IEEE, (2006)Generating At-Speed Array Fail Maps with Low-Speed ATE., , и . VTS, стр. 87-96. IEEE Computer Society, (2004)A 1.0GHz multi-banked embedded DRAM in 65nm CMOS featuring concurrent refresh and hierarchical BIST., , , , , , , , , и 1 other автор(ы). CICC, стр. 795-798. IEEE, (2007)A 5.6-ns random cycle 144-Mb DRAM with 1.4 Gb/s/pin and DDR3-SRAM interface., , , , , , и . IEEE J. Solid State Circuits, 38 (11): 1974-1980 (2003)Embedded DRAM design and architecture for the IBM 0.11-µm ASIC offering., , , , , , , , и . IBM J. Res. Dev., 46 (6): 675-690 (2002)Embedded DRAM built in self test and methodology for test insertion., , , , , , , и . ITC, стр. 975-984. IEEE Computer Society, (2001)