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Clustering techniques and statistical fault injection for selective mitigation of SEUs in flip-flops.

A. Evans, M. Nicolaidis, S. Wen, and T. Asis. ISQED, page 727-732. IEEE, (2013)

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Wen-Jie Dai

Zhou Jie

Yucheng Jie

Jie Ding

Jie Liu

Other publications of authors with the same name

Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller.Y. Ren, S. Shi, L. Chen, H. Wang, L. Gao, G. Guo, S. Wen, R. Wong, and N. van Vonno. J. Electron. Test., 29 (4): 609-616 (2013)Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser.Y. Ren, A. He, S. Shi, G. Guo, L. Chen, S. Wen, R. Wong, N. van Vonno, and B. Bhuva. J. Electron. Test., 30 (1): 149-154 (2014)A fully integrated 40pF output capacitor beat-frequency-quantizer-based digital LDO with built-in adaptive sampling and active voltage positioning.S. Kundu, M. Liu, R. Wong, S. Wen, and C. Kim. ISSCC, page 308-310. IEEE, (2018)Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies.J. Cao, L. Xu, B. Bhuva, S. Wen, R. Wong, B. Narasimham, and L. Massengill. IRPS, page 1-5. IEEE, (2019)Placement of repair circuits for in-field FPGA repair.M. Wirthlin, J. Jensen, A. Wilson, W. Howes, S. Wen, and R. Wong. FPGA, page 115-124. ACM, (2013)Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment.Y. Xiong, A. Feeley, N. Pieper, D. Ball, B. Narasimham, J. Brockman, N. Dodds, S. Wender, S. Wen, R. Fung and 1 other author(s). IRPS, page 7. IEEE, (2022)Performance, metastability and soft-error robustness tradeoffs for flip-flops in 40nm CMOS.D. Rennie, D. Li, M. Sachdev, B. Bhuva, S. Jagannathan, S. Wen, and R. Wong. CICC, page 1-4. IEEE, (2011)IZIP: In-place zero overhead interconnect protection via PIP redundancy.Y. Luo, A. Evans, S. Wen, R. Wong, and G. Chen. ASICON, page 565-568. IEEE, (2017)Traffic Anomaly Detection Via Conditional Normalizing Flow.Z. Kang, A. Mukhopadhyay, A. Gokhale, S. Wen, and A. Dubey. ITSC, page 2563-2570. IEEE, (2022)Temperature Dependence of Single-Event Transient Pulse Widths for 7-nm Bulk FinFET Technology.J. Cao, L. Xu, S. Wen, R. Fung, B. Narasimham, L. Massengill, and B. Bhuva. IRPS, page 1-5. IEEE, (2020)

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Disambiguation of "Wen, Shi-Jie"

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Clustering techniques and statistical fault injection for selective mitigation of SEUs in flip-flops.

Please choose a person to relate this publication to

Wen-Jie Dai

Zhou Jie

Yucheng Jie

Jie Ding

Jie Liu

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Wen, Shi-Jie"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Clustering techniques and statistical fault injection for selective mitigation of SEUs in flip-flops.

Please choose a person to relate this publication to

Wen-Jie Dai

Zhou Jie

Yucheng Jie

Jie Ding

Jie Liu

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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Clustering techniques and statistical fault injection for selective mitigation of SEUs in flip-flops.