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Disambiguation of "Nii, Koji"

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A 298-fJ/writecycle 650-fJ/readcycle 8T three-port SRAM in 28-nm FD-SOI process technology for image processor.

, , , , , , , , , and . CICC, page 1-4. IEEE, (2015)

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Koji Kameo

Koji Onoda

Koji Ota

Tomoko Kojima

Seth Nii-Annang

 

Other publications of authors with the same name

A low power SRAM using auto-backgate-controlled MT-CMOS., , , , , , , and . ISLPED, page 293-298. ACM, (1998)A stable chip-ID generating physical uncloneable function using random address errors in SRAM., , , , , , and . SoCC, page 143-147. IEEE, (2012)A 32×24-bit multiplier-accumulator with advanced rectangular styled Wallace-tree structure., , , , , and . ISCAS (1), page 73-76. IEEE, (2005)Design Challenges in 3-D SoC Stacked With a 12.8 GB/s TSV Wide I/O DRAM., , , , and . IEEE J. Emerg. Sel. Topics Circuits Syst., 6 (3): 364-372 (2016)A 28nm High-κ metal-gate single-chip communications processor with 1.5GHz dual-core application processor and LTE/HSPA+-capable baseband processor., , , , , , , , , and 5 other author(s). ISSCC, page 156-157. IEEE, (2013)The LSI implementation of a memory based field programmable device for MCU peripherals., , , , , , and . DDECS, page 183-188. IEEE Computer Society, (2014)28 nm 50% Power-Reducing Contacted Mask Read Only Memory Macro With 0.72-ns Read Access Time Using 2T Pair Bitcell and Dynamic Column Source Bias Control Technique., , , , , , , , , and 1 other author(s). IEEE Trans. Very Large Scale Integr. Syst., 22 (3): 575-584 (2014)FEOL/BEOL wear-out estimator using stress-to-frequency conversion of voltage/temperature-sensitive ring oscillators for 28nm automotive MCUs., , , , , and . ESSCIRC, page 265-268. IEEE, (2016)Worst-case analysis to obtain stable read/write DC margin of high density 6T-SRAM-array with local Vth variability., , , , , , , , and . ICCAD, page 398-405. IEEE Computer Society, (2005)A dynamic power reduction in synchronous 2RW 8T dual-port SRAM by adjusting wordline pulse timing with same/different row access mode., , , and . A-SSCC, page 13-16. IEEE, (2017)