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Worst-case analysis to obtain stable read/write DC margin of high density 6T-SRAM-array with local Vth variability.

, , , , , , , , и . ICCAD, стр. 398-405. IEEE Computer Society, (2005)

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Hiroshi Kawabe

Hiroshi Murata

Hiroshi Kubota

Hiroshi Uchida

Hiroshi Fukuzaki

 

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