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Hierarchical Delay Test Generation., , and . J. Electron. Test., 10 (3): 231-244 (1997)Fault-tolerant routing in multiply twisted cube topology., and . J. Syst. Archit., 42 (4): 279-288 (1996)Incomplete Star Graph: An Economical Fault-tolerant Interconnection Network., , and . ICPP (1), page 83-90. CRC Press, (1993)Improvement of ASIC Design Processes., , and . ASP-DAC/VLSI Design, page 105-. IEEE Computer Society, (2002)A Polynomial-Time Algorithm for Power Constrained Testing of Core Based Systems., , and . Asian Test Symposium, page 107-112. IEEE Computer Society, (1999)A STAFAN-like functional testability measure for register-level circuits., , and . Asian Test Symposium, page 192-198. IEEE Computer Society, (1995)A Framework for Distributed and Hierarchical Design-for-Test., , , , , and . VLSI Design, page 497-503. IEEE Computer Society, (2005)A stochastic pattern generation and optimization framework for variation-tolerant, power-safe scan test., , and . ITC, page 1-10. IEEE Computer Society, (2007)Enhanced launch-off-capture transition fault testing., , and . ITC, page 10. IEEE Computer Society, (2005)Design of WDM Networks for Delay-Bound Multicasting., , and . HiPC, volume 1745 of Lecture Notes in Computer Science, page 399-403. Springer, (1999)