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Disambiguation of "Wen, Shi-Jie"

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Mitigating the effects of large multiple cell upsets (MCUs) in memories.

, , , , and . ACM Trans. Design Autom. Electr. Syst., 16 (4): 45:1-45:10 (2011)

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Wen-Jie Dai

Zhou Jie

Yucheng Jie

Jie Liu

Jie Huang

 

Other publications of authors with the same name

Modeling and analysis of single-event transient sensitivity of a 65 nm clock tree., , , , , , , , , and 3 other author(s). Microelectron. Reliab., (2018)Quantitative SEU Fault Evaluation for SRAM-Based FPGA Architectures and Synthesis Algorithms., , , , , , , and . FPL, page 282-285. IEEE Computer Society, (2011)Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node., , , , , , , and . IRPS, page 1-5. IEEE, (2020)Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter., , , , , , , and . J. Electron. Test., 28 (6): 877-883 (2012)Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller., , , , , , , , and . J. Electron. Test., 29 (4): 609-616 (2013)Temporal and frequency characteristic analysis of margin-related failures caused by an intermittent nano-scale fracture of the solder ball in a BGA package device., , , and . Microelectron. Reliab., (2017)Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser., , , , , , , , and . J. Electron. Test., 30 (1): 149-154 (2014)A fully integrated 40pF output capacitor beat-frequency-quantizer-based digital LDO with built-in adaptive sampling and active voltage positioning., , , , and . ISSCC, page 308-310. IEEE, (2018)Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies., , , , , , and . IRPS, page 1-5. IEEE, (2019)Clustering techniques and statistical fault injection for selective mitigation of SEUs in flip-flops., , , and . ISQED, page 727-732. IEEE, (2013)