From post

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

 

Другие публикации лиц с тем же именем

BIST-Aided Scan Test - A New Method for Test Cost Reduction., , , , , , и . VTS, стр. 359-364. IEEE Computer Society, (2003)Multiple Fault Diagnosis in Logic Circuits Using EB Tester and Multiple/Single Fault Simulators., , , и . Asian Test Symposium, стр. 341-346. IEEE Computer Society, (1999)Design of C-Testable Multipliers Based on the Modified Booth Algorithm., , и . Asian Test Symposium, стр. 42-47. IEEE Computer Society, (1997)The adoption of socio- and bio-inspired algorithms for trust models in wireless sensor networks: A survey., , и . Int. J. Commun. Syst., (2018)General BIST-Amenable Method of Test Generation for Iterative Logic Arrays., , и . VTS, стр. 171-178. IEEE Computer Society, (2000)On diagnosing multiple stuck-at faults using multiple and singlefault simulation in combinational circuits., , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 21 (3): 362-368 (2002)A Method of Generating Tests for Marginal Delays an Delay Faults in Combinational Circuits., , , и . Asian Test Symposium, стр. 320-325. IEEE Computer Society, (1997)Diagnosis of Single Gate Delay Faults in Combinational Circuits using Delay Fault Simulation., , и . Asian Test Symposium, стр. 108-112. IEEE Computer Society, (1998)A Method of Static Compaction of Test Stimuli., , и . Asian Test Symposium, стр. 137-144. IEEE Computer Society, (2001)Small-Scale Fading Characteristics in Cellular Networks in Ghana., , , и . Int. J. Interdiscip. Telecommun. Netw., 5 (3): 23-33 (2013)