( en | de | ru )

 

Disambiguation of "Potin, Olivier"

Author of the publication

copydeleteadd this publication to your clipboard
Implementing model redundancy in predictive alternate test to improve test confidence.

, , , , , , and . ETS, page 1. IEEE Computer Society, (2013)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Thomas Potinecke

Methode zur Systematisierung von Teilprozessen in der Produktentwicklung beim Einsatz von CAx-Technologien. Uni Stuttgart, (2009)

Werner Potinecke

Annette Pöting

Helmut Pöting

Leopold Potinus

 

Other publications of authors with the same name

Assessing body built-in current sensors for detection of multiple transient faults., , , , , , and . Microelectron. Reliab., (2018)A CFI Verification System based on the RISC-V Instruction Trace Encoder., , , and . DSD, page 456-463. IEEE, (2022)Experimental EMFI detection on a RISC-V core using the Trace Verifier solution., , , and . Microprocess. Microsystems, (2023)Real-Time Frequency Detection to Synchronize Fault Injection on System-on-Chip., , , , and . IACR Cryptol. ePrint Arch., (2022)Software-Only Control-Flow Integrity Against Fault Injection Attacks., , , and . DSD, page 269-277. IEEE, (2023)Combined Fault Injection and Real-Time Side-Channel Analysis for Android Secure-Boot Bypassing., , , , and . CARDIS, volume 13820 of Lecture Notes in Computer Science, page 25-44. Springer, (2022)Making predictive analog/RF alternate test strategy independent of training set size., , , , , , and . ITC, page 1-9. IEEE Computer Society, (2012)A CCFI Verification Scheme Based on the RISC-V Trace Encoder., , , and . COSADE, volume 13979 of Lecture Notes in Computer Science, page 42-61. Springer, (2023)Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection., , , , , and . Microelectron. Reliab., 53 (9-11): 1320-1324 (2013)Smart selection of indirect parameters for DC-based alternate RF IC testing., , , , , , , and . VTS, page 19-24. IEEE Computer Society, (2012)