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Analysis of jitter accumulation in interleaved phase frequency detectors for high-accuracy on-chip jitter measurements.

, , , , , , и . ISOCC, стр. 146-149. IEEE, (2011)

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Haruo Oba

Yoshitake Kobayashi

Wakiko Kobayashi

Wataru Kobayashi

Makoto Kobayashi

 

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