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Characterization of time-dependent variability using 32k transistor arrays in an advanced HK/MG technology.

P. Weckx, B. Kaczer, C. Chen, J. Franco, E. Bury, K. Chanda, J. Watt, P. Roussel, F. Catthoor, and G. Groeseneken. IRPS, page 3. IEEE, (2015)

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Global Multimedia System Design Exploration Using Accurate Memory Organization Feedback.A. Vandecappelle, M. Miranda, E. Brockmeyer, F. Catthoor, and D. Verkest. DAC, page 327-332. ACM Press, (1999)Distributed Loop Controller for Multithreading in Unithreaded ILP Architectures.P. Raghavan, A. Lambrechts, M. Jayapala, F. Catthoor, and D. Verkest. IEEE Trans. Computers, 58 (3): 311-321 (2009)Accuracy of Quasi-Monte Carlo technique in failure probability estimations.M. Noltsis, P. Weckx, D. Rodopoulos, F. Catthoor, and D. Soudris. ICICDT, page 1-4. IEEE, (2016)Understanding timing impact of BTI/RTN with massively threaded atomistic transient simulations.D. Rodopoulos, D. Stamoulis, G. Lyras, D. Soudris, and F. Catthoor. ICICDT, page 1-4. IEEE, (2014)A tool flow for predicting system level timing failures due to interconnect reliability degradation.J. Guo, A. Papanikolaou, M. Stucchi, K. Croes, Z. Tokei, and F. Catthoor. ACM Great Lakes Symposium on VLSI, page 291-296. ACM, (2008)Finite precision processing in wireless applications.D. Novo, M. Li, B. Bougard, L. der Perre, and F. Catthoor. DATE, page 1230-1233. IEEE, (2009)Towards high-performance polarity-controllable FETs with 2D materials.G. Resta, J. Gonzalez, Y. Balaji, T. Agarwal, D. Lin, F. Catthoor, I. Radu, G. Micheli, and P. Gaillardon. DATE, page 637-641. IEEE, (2018)Degradation analysis of high performance 14nm FinFET SRAM.D. Kraak, I. Agbo, M. Taouil, S. Hamdioui, P. Weckx, S. Cosemans, and F. Catthoor. DATE, page 201-206. IEEE, (2018)Data memory optimization in LTE downlink.N. Sharma, T. Aa, P. Agrawal, P. Raghavan, P. Panda, and F. Catthoor. ICASSP, page 2610-2614. IEEE, (2013)Systematic architecture exploration based on optimistic cycle estimation for low energy embedded processors.I. Taniguchi, M. Jayapala, P. Raghavan, F. Catthoor, K. Sakanushi, Y. Takeuchi, and M. Imai. ASP-DAC, page 449-454. IEEE, (2009)

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Characterization of time-dependent variability using 32k transistor arrays in an advanced HK/MG technology.

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Disambiguation of "Catthoor, Francky"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Characterization of time-dependent variability using 32k transistor arrays in an advanced HK/MG technology.

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Characterization of time-dependent variability using 32k transistor arrays in an advanced HK/MG technology.