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A design for testability scheme to reduce test application time in full scan., and . VTS, page 55-60. IEEE Computer Society, (1992)Computer-aided fault to defect mapping (CAFDM) for defect diagnosis., , , , , and . ITC, page 729-738. IEEE Computer Society, (2000)Integrating Automated Diagnosis into the Testing and Failure Analysis Operations., , , , and . ITC, page 934. IEEE Computer Society, (1996)On applying non-classical defect models to automated diagnosis., , , , , , and . ITC, page 748-757. IEEE Computer Society, (1998)Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques., , , and . ITC, page 355-364. IEEE Computer Society, (2004)Desgin for Testability of Asynchronous Sequential Circuits., and . ICCD, page 518-522. IEEE Computer Society, (1993)Modeling Test Escape Rate as a Function of Multiple Coverages., , and . ITC, page 1-9. IEEE Computer Society, (2008)Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges ., , , , , , , and . ITC, page 1120-1129. IEEE Computer Society, (2002)An empirical study on the effects of test type ordering on overall test efficiency., and . ITC, page 408-416. IEEE Computer Society, (2000)An analysis of power reduction techniques in scan testing., , and . ITC, page 670-677. IEEE Computer Society, (2001)