( en | de | ru )

 

Disambiguation of "Balachandran, Hari"

Author of the publication

copydeleteadd this publication to your clipboard
On applying non-classical defect models to automated diagnosis.

, , , , , , and . ITC, page 748-757. IEEE Computer Society, (1998)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Prakash Balachandran

Muthuswami Balachandran

Hari Paudel

Hari Petsos

Jürg Hari

 

Other publications of authors with the same name

Facilitating Rapid First Silicon Debug., , and . ITC, page 628-637. IEEE Computer Society, (2002)Logic mapping on a microprocessor., , , and . ITC, page 701-710. IEEE Computer Society, (2000)Improvement of SRAM-based failure analysis using calibrated Iddq testing., and . VTS, page 130-137. IEEE Computer Society, (1996)Correlation of logical failures to a suspect process step., , , , , , and . ITC, page 458-476. IEEE Computer Society, (1999)Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs., , , and . VTS, page 444-452. IEEE Computer Society, (2000)Computer-aided fault to defect mapping (CAFDM) for defect diagnosis., , , , , and . ITC, page 729-738. IEEE Computer Society, (2000)REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen., , , , , , , , , and 1 other author(s). VTS, page 268-274. IEEE Computer Society, (1999)On applying non-classical defect models to automated diagnosis., , , , , , and . ITC, page 748-757. IEEE Computer Society, (1998)Clustering based techniques for I_DDQ testing., , and . ITC, page 730-737. IEEE Computer Society, (1999)Expediting ramp-to-volume production., , , , , , and . ITC, page 103-112. IEEE Computer Society, (1999)