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CATAPULT: Concurrent Automatic Testing Allowing Parallelization and Using Limited Topology., , , and . DAC, page 597-600. ACM, (1988)What we know after twelve years developing and deploying test data analytics solutions., , and . ITC, page 1-8. IEEE, (2016)Modeling Test Escape Rate as a Function of Multiple Coverages., , and . ITC, page 1-9. IEEE Computer Society, (2008)Facilitating Rapid First Silicon Debug., , and . ITC, page 628-637. IEEE Computer Society, (2002)Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling., , , , , and . ITC, page 1-10. IEEE Computer Society, (2014)The roles of controllability and observability in design for test., , , and . VTS, page 211-216. IEEE Computer Society, (1992)Test Generation and Design for Test for a Large Multiprocessing DSP., , , and . ITC, page 149-156. IEEE Computer Society, (1995)Early prediction of NBTI effects using RTL source code analysis., , , and . DAC, page 808-813. ACM, (2012)The stuck-at fault: it ain't over 'til it's over.. ITC, page 1165. IEEE Computer Society, (1998)Integrating Automated Diagnosis into the Testing and Failure Analysis Operations., , , , and . ITC, page 934. IEEE Computer Society, (1996)