Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Testing Finite State Machines Based on a Structural Coverage Metric ., and . ITC, page 773-780. IEEE Computer Society, (2002)Incorporating Physical Design-for-Test into Routing., and . ITC, page 685-693. IEEE Computer Society, (1997)Defect Classes - An Overdue Paradigm for CMOS IC., , , and . ITC, page 413-425. IEEE Computer Society, (1994)Maximum Likelihood Estimation for Yield Analysis., and . DFT, page 149-158. IEEE Computer Society, (1996)A Study of Undetectable Non-Feedback Shorts for the Purpose of Physical-DFT., and . EDAC-ETC-EUROASIC, page 371-375. IEEE Computer Society, (1994)Test Pattern Generation for Realistic Bridge Faults in CMOS ICs., and . ITC, page 492-499. IEEE Computer Society, (1991)Detection of Multiple Faults in Two-Dimensional ILAs., and . IEEE Trans. Computers, 45 (6): 741-746 (1996)On state reduction of incompletely specified finite state machines., and . Comput. Electr. Eng., 33 (1): 58-69 (2007)Extraction and Simulation of Realistic CMOS Faults Using Inductive Fault Analysis., and . ITC, page 475-484. IEEE Computer Society, (1988)Carafe: an inductive fault analysis tool for CMOS VLSI circuits., and . VTS, page 92-98. IEEE Computer Society, (1993)