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Disambiguation of "Diaz-Fortuny, Javier"

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Design Considerations of an SRAM Array for the Statistical Validation of Time-Dependent Variability Models.

, , , , , , , , , , , and . SMACD, page 73-76. IEEE, (2018)

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Joaquim Fortuny

Gonzalo Díaz Díaz

Leonardo Díaz

Carlos Diaz Cascajo

Juan Díaz Ochoa

 

Other publications of authors with the same name

A Smart SRAM-Cell Array for the Experimental Study of Variability Phenomena in CMOS Technologies., , , , , , and . IRPS, page 3-1. IEEE, (2022)Improving the Tamper-Aware Odometer Concept by Enhancing Dynamic Stress Operation., , , , , and . IRPS, page 1-9. IEEE, (2023)A New Time Efficient Methodology for the Massive Characterization of RTN in CMOS Devices., , , , , , , , and . IRPS, page 1-5. IEEE, (2019)Demonstration of Chip Overclock Detection by Employing Tamper-Aware Odometer Technology., , , , , and . IRPS, page 4. IEEE, (2024)Using dedicated device arrays for the characterization of TDDB in a scaled HK/MG technology., , , , , and . IRPS, page 1-6. IEEE, (2023)Reliability challenges in Forksheet Devices: (Invited Paper)., , , , , , , , , and 2 other author(s). IRPS, page 1-8. IEEE, (2023)Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability., , , , , , , and . IRPS, page 1-9. IEEE, (2023)Design Considerations of an SRAM Array for the Statistical Validation of Time-Dependent Variability Models., , , , , , , , , and 2 other author(s). SMACD, page 73-76. IEEE, (2018)TARS: A toolbox for statistical reliability modeling of CMOS devices., , , , , , and . SMACD, page 1-4. IEEE, (2017)A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging., , , , , , , , , and . SMACD, page 1-4. IEEE, (2017)