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Другие публикации лиц с тем же именем

Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data., , , и . ITC, стр. 1240. IEEE Computer Society, (2002)Die-level adaptive test: Real-time test reordering and elimination., , , , и . ITC, стр. 1-10. IEEE Computer Society, (2011)A radio-frequency CMOS active inductor and its application in designing high-Q filters., , , , и . ISCAS (4), стр. 197-200. IEEE, (2004)Variance reduction using wafer patterns in I_ddQ data., , , и . ITC, стр. 189-198. IEEE Computer Society, (2000)Variance reduction and outliers: statistical analysis of semiconductor test data., и . ITC, стр. 9. IEEE Computer Society, (2005)The value of statistical testing for quality, yield and test cost improvement., , , и . ITC, стр. 10. IEEE Computer Society, (2005)Burn-in reduction using principal component analysis., , и . ITC, стр. 10. IEEE Computer Society, (2005)Isolating and Removing Sources of Variation in Test Data., , , , и . ITC, стр. 464-471. IEEE Computer Society, (2002)TEM2P2EST: A Thermal Enabled Multi-model Power/Performance ESTimator., , , и . PACS, том 2008 из Lecture Notes in Computer Science, стр. 112-125. Springer, (2000)High Speed Interconnection Using the Clos Network., , и . ICS, том 297 из Lecture Notes in Computer Science, стр. 96-111. Springer, (1987)